David Myers is currently pursuing a Ph.D. in mechanical engineering under the guidance of Prof. Albert P. Pisano. He received the M.S. from UC Berkeley and B.S. from Virginia Commonwealth University, both in mechanical engineering. His research interests include Silicon Carbide (SiC) for MEMS resonant sensors and sputtered ion beam deposition of MEMS materials for novel encapsulation techniques.

Email: david.myers@emory.edu

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